DTIC ADA040611: Dual Mode Logic for Function pdf

DTIC ADA040611: Dual Mode Logic for Function

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Description of the Book:

A method of using hardware redundancy to ease the problem of fault testing in combinational and sequential logic circuits is presented. Dual-mode logic gates are used to construct combinational logic circuits which can be tested for all single stuck-at faults using just two function-independent tests. Analogous results for sequential circuits are also presented. (Author

• Creator/s: Defense Technical Information Center
• Date: 5/1/1977
• Year: 1977
• Book Topics/Themes: DTIC Archive, Dasgupta, S, SYRACUSE UNIV N Y DEPT OF INDUSTRIAL ENGINEERING AND OPERATIONS RESEARCH, *GATES(CIRCUITS), *LOGIC CIRCUITS, DIGITAL SYSTEMS, NETWORKS, BUILDINGS, INTEGRATED CIRCUITS, SEQUENTIAL ANALYSIS, DUAL MODE, RELIABILITY(ELECTRONICS), FAULTS, NAND GATES, NOR GATES

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