NASA Technical Reports Server (NTRS) : Electrical pdf

NASA Technical Reports Server (NTRS) : Electrical

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Description of the Book:

The electrical characterization and qualification test results are presented for the RCA MWS5001D random access memory. The tests included functional tests, AC and DC parametric tests, AC parametric worst-case pattern selection test, determination of worst-case transition for setup and hold times, and a series of schmoo plots. The address access time, address readout time, the data hold time, and the data setup time are some of the results surveyed

• Creator/s: NASA Technical Reports Server (NTRS
• Date: 6/1/1979
• Year: 1979
• Book Topics/Themes: NASA Technical Reports Server (NTRS), ELECTRONIC EQUIPMENT TESTS, RANDOM ACCESS MEMORY, TABLES (DATA), DATA REDUCTION, ELECTRICAL MEASUREMENT, INPUT/OUTPUT ROUTINES, PRINTOUTS, READOUT, Klute, A

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