NASA Technical Reports Server (NTRS) : Processed pdf

NASA Technical Reports Server (NTRS) : Processed

More Book Details

Description of the Book:

The defect structure of processed edge defined film-fed growth (EFG) silicon ribbons was studied using a variety of electron microscopic techniques. Comparison between the present results and previous studies on as-grown ribbons has shown that solar cell processing introduces additional defects into the ribbons. The creation of point defects during high temperature phosphorus diffusion induces dislocation climb, resulting in the formation of dislocation helices in the diffused layer

• Creator/s: NASA Technical Reports Server (NTRS
• Date: 5/1/1982
• Year: 1982
• Book Topics/Themes: NASA Technical Reports Server (NTRS), CRYSTAL DISLOCATIONS, POINT DEFECTS, SILICON, SOLAR CELLS, TEMPERATURE GRADIENTS, DIFFUSION, ELECTRON MICROSCOPY, PHOSPHORUS, Cunningham, B., Ast, D. G

An excerpt captured from the PDF book